Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Instrumentation
سال: 2018
ISSN: 1748-0221
DOI: 10.1088/1748-0221/13/12/p12009